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2 Produits
| Photo. | Type | Prix | Quantité | Stocks | Fabricant | Description | Package / Case | Series | Packaging | Number of Bits | Logic Type | Mounting Type | Operating Temperature | Part Status | Supplier Device Package | Factory Stock | @ qty | Minimum Quantity | Supply Voltage | |
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Regarder | Texas Instruments | IC SCAN TEST DEVICE LATCH 24SOIC | 24-SOIC (0.295", 7.50mm Width) | 74BCT | Tube | 8 | Scan Test Device with D-Type Latches | Surface Mount | 0°C ~ 70°C | Active | 24-SOIC | 800 | 0 | 75 | 4.5 V ~ 5.5 V | |||
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Obtenir une offre |
199
On a de la marchandise.
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Texas Instruments | IC SCAN TEST DEVICE ABT 64-LQFP | 64-LQFP | 74LVTH | Tray | 18 | ABT Scan Test Device With Transceivers and Registers | Surface Mount | -40°C ~ 85°C | Active | 64-LQFP (10x10) | 800 | 0 | 1 | 2.7 V ~ 3.6 V |
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