- Filtre sélectionné :
1 Produits
| Photo. | Type | Prix | Quantité | Stocks | Fabricant | Description | Package / Case | Series | Packaging | Number of Bits | Logic Type | Mounting Type | Operating Temperature | Part Status | Supplier Device Package | Factory Stock | @ qty | Minimum Quantity | Supply Voltage | |
|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
|
|
Obtenir une offre |
111
On a de la marchandise.
|
Texas Instruments | IC SCAN-TEST-DEV/XCVR 28-SOIC | 28-SOIC (0.295", 7.50mm Width) | 74ABT | Tube | 8 | Scan Test Device with Bus Transceiver and Registers | Surface Mount | -40°C ~ 85°C | Active | 28-SOIC | 1700 | 0 | 1 | 4.5 V ~ 5.5 V |
1 / 1 Page
