Mettre en place une plate - forme commerciale fiable pour les fabricants et les fournisseurs dans le monde entier.
Number of Elements :
Number of Bits per Element :
222 Produits
Photo. Type Prix Quantité Stocks Fabricant Description Package / Case Series Packaging Input Type Output Type Logic Type Mounting Type Number of Elements Operating Temperature Part Status Voltage - Supply Supplier Device Package Number of Bits per Element Current - Output High, Low Factory Stock @ qty Minimum Quantity
Default Photo
Regarder
RFQ
Texas Instruments IC SCAN TEST DEVICE 24SOIC 24-SOIC (0.295", 7.50mm Width) 74BCT Tape & Reel (TR)     Scan Test Device with D-Type Edge-Triggered Flip-Flops Surface Mount   0°C ~ 70°C Obsolete   24-SOIC     0 0 2000
Default Photo
Regarder
RFQ
Texas Instruments IC SCAN TEST DEVICE 24SOIC 24-SOIC (0.295", 7.50mm Width) 74BCT Tape & Reel (TR)     Scan Test Device with D-Type Latches Surface Mount   0°C ~ 70°C Obsolete   24-SOIC     0 0 2000
Default Photo
Regarder
RFQ
Texas Instruments IC SCAN TEST DEVICE 24SOIC 24-SOIC (0.295", 7.50mm Width) 74BCT Tape & Reel (TR)     Scan Test Device with Inverting Buffers Surface Mount   0°C ~ 70°C Obsolete   24-SOIC     0 0 2000
Default Photo
Regarder
RFQ
Texas Instruments IC TRANSCEIVER 1-9BIT 24SOIC 24-SOIC (0.295", 7.50mm Width) 74BCT Tape & Reel (TR)     8-Bit to 9-Bit Parity Bus Transceiver Surface Mount   0°C ~ 70°C Obsolete   24-SOIC     0 0 2000
Default Photo
Regarder
RFQ
Texas Instruments IC SCAN TEST DEVICE W/FF 24-DIP 24-DIP (0.300", 7.62mm) 74BCT Tube     Scan Test Device with D-Type Edge-Triggered Flip-Flops Through Hole   0°C ~ 70°C Obsolete   24-PDIP     0 0 60
Default Photo
Regarder
RFQ
Texas Instruments IC SCAN TEST DEVICE W/FF 24-DIP 24-DIP (0.300", 7.62mm) 74BCT Tube     Scan Test Device with D-Type Edge-Triggered Flip-Flops Through Hole   0°C ~ 70°C Obsolete   24-PDIP     0 0 60
Default Photo
Regarder
RFQ
Texas Instruments IC SCAN TEST DEVICE W/FF 24-SOIC 24-SOIC (0.295", 7.50mm Width) 74BCT Tape & Reel (TR)     Scan Test Device with D-Type Edge-Triggered Flip-Flops Surface Mount   0°C ~ 70°C Obsolete   24-SOIC     0 0 2000
Default Photo
Regarder
RFQ
Texas Instruments IC SCAN TEST DEVICE W/FF 24-SOIC 24-SOIC (0.295", 7.50mm Width) 74BCT Tape & Reel (TR)     Scan Test Device with D-Type Edge-Triggered Flip-Flops Surface Mount   0°C ~ 70°C Obsolete   24-SOIC     0 0 2000
Default Photo
Regarder
RFQ
Texas Instruments IC SCAN TEST DEVICE LATCH 24-DIP 24-DIP (0.300", 7.62mm) 74BCT Tube     Scan Test Device with D-Type Latches Through Hole   0°C ~ 70°C Obsolete   24-PDIP     0 0 60
Default Photo
Regarder
RFQ
Texas Instruments IC SCAN TEST DEVICE LATCH 24SOIC 24-SOIC (0.295", 7.50mm Width) 74BCT Tape & Reel (TR)     Scan Test Device with D-Type Latches Surface Mount   0°C ~ 70°C Obsolete   24-SOIC     0 0 2000
Default Photo
Regarder
RFQ
Texas Instruments IC SCAN TEST DEVICE LATCH 24SOIC 24-SOIC (0.295", 7.50mm Width) 74BCT Tape & Reel (TR)     Scan Test Device with D-Type Latches Surface Mount   0°C ~ 70°C Obsolete   24-SOIC     0 0 2000
Default Photo
Regarder
RFQ
Texas Instruments IC SCAN TEST DEVICE TXRX 24-DIP 24-DIP (0.300", 7.62mm) 74BCT Tube     Scan Test Device with Bus Transceivers Through Hole   0°C ~ 70°C Obsolete   24-PDIP     0 0 60
Default Photo
Regarder
RFQ
Texas Instruments IC SCAN TEST DEVICE TXRX 24-DIP 24-DIP (0.300", 7.62mm) 74BCT Tube     Scan Test Device with Bus Transceivers Through Hole   0°C ~ 70°C Obsolete   24-PDIP     0 0 60
Default Photo
Regarder
RFQ
Texas Instruments IC SCAN TEST DEVICE BUFF 24-DIP 24-DIP (0.300", 7.62mm) 74BCT Tube     Scan Test Device with Buffers Through Hole   0°C ~ 70°C Obsolete   24-PDIP     0 0 60
Default Photo
Regarder
RFQ
Texas Instruments IC SCAN TEST DEVICE BUFF 24-DIP 24-DIP (0.300", 7.62mm) 74BCT Tube     Scan Test Device with Buffers Through Hole   0°C ~ 70°C Obsolete   24-PDIP     0 0 60
Default Photo
Regarder
RFQ
Texas Instruments IC SCAN TEST DEVICE BUFF 24-SOIC 24-SOIC (0.295", 7.50mm Width) 74BCT Tape & Reel (TR)     Scan Test Device with Buffers Surface Mount   0°C ~ 70°C Discontinued at Digi-Key   24-SOIC     0 0 2000
Default Photo
Regarder
RFQ
Texas Instruments IC SCAN TEST DEVICE BUFF 24-DIP 24-DIP (0.300", 7.62mm) 74BCT Tube     Scan Test Device with Inverting Buffers Through Hole   0°C ~ 70°C Obsolete   24-PDIP     0 0 60
Default Photo
Regarder
RFQ
Texas Instruments IC SCAN TEST DEVICE BUFF 24-DIP 24-DIP (0.300", 7.62mm) 74BCT Tube     Scan Test Device with Inverting Buffers Through Hole   0°C ~ 70°C Obsolete   24-PDIP     0 0 60
Default Photo
Regarder
RFQ
Texas Instruments IC SCAN TEST DEVICE BUFF 24-SOIC 24-SOIC (0.295", 7.50mm Width) 74BCT Tape & Reel (TR)     Scan Test Device with Inverting Buffers Surface Mount   0°C ~ 70°C Obsolete   24-SOIC     0 0 2000
Default Photo
Regarder
RFQ
Texas Instruments IC SCAN TEST DEVICE BUFF 24-SOIC 24-SOIC (0.295", 7.50mm Width) 74BCT Tape & Reel (TR)     Scan Test Device with Inverting Buffers Surface Mount   0°C ~ 70°C Obsolete   24-SOIC     0 0 2000
Default Photo
Regarder
RFQ
Texas Instruments IC TRANSCEIVER 1-9BIT 24DIP 24-DIP (0.300", 7.62mm) 74BCT Tube     8-Bit to 9-Bit Parity Bus Transceiver Through Hole   0°C ~ 70°C Obsolete   24-PDIP     0 0 120
Default Photo
Regarder
RFQ
Texas Instruments IC TRANSCEIVER 1-9BIT 24SOIC 24-SOIC (0.295", 7.50mm Width) 74BCT Tape & Reel (TR)     8-Bit to 9-Bit Parity Bus Transceiver Surface Mount   0°C ~ 70°C Obsolete   24-SOIC     0 0 2000
Default Photo
Regarder
RFQ
Texas Instruments IC TRANSCEIVER 1-9BIT 24SOIC 24-SOIC (0.295", 7.50mm Width) 74BCT Tape & Reel (TR)     8-Bit to 9-Bit Parity Bus Transceiver Surface Mount   0°C ~ 70°C Obsolete   24-SOIC     0 0 2000
Default Photo
Regarder
RFQ
Texas Instruments IC DECODER MEM DUAL 2-4 20-SOIC 20-SOIC (0.295", 7.50mm Width) 74BCT Tape & Reel (TR)     Memory Decoder Surface Mount   0°C ~ 75°C Obsolete   20-SOIC     0 0 2000
Default Photo
Unité
$4.1299
Regarder
RFQ
Texas Instruments IC SCAN TEST DEVICE BUFF 24-SOIC 24-SOIC (0.295", 7.50mm Width) 74BCT Tube     Scan Test Device with Buffers Surface Mount   0°C ~ 70°C Active   24-SOIC     0 0 50
Default Photo
Unité
$3.9997
Regarder
RFQ
Texas Instruments IC SCAN TEST DEVICE TXRX 24-SOIC 24-SOIC (0.295", 7.50mm Width) 74BCT Tube     Scan Test Device with Bus Transceivers Surface Mount   0°C ~ 70°C Active   24-SOIC     1300 0 50
Default Photo
Unité
$3.6933
Regarder
RFQ
Texas Instruments IC SCAN TEST DEVICE LATCH 24SOIC 24-SOIC (0.295", 7.50mm Width) 74BCT Tube     Scan Test Device with D-Type Latches Surface Mount   0°C ~ 70°C Active   24-SOIC     800 0 75
Default Photo
Unité
$3.6933
Regarder
RFQ
Texas Instruments IC SCAN TEST DEVICE BUFF 24-SOIC 24-SOIC (0.295", 7.50mm Width) 74BCT Tube     Scan Test Device with Inverting Buffers Surface Mount   0°C ~ 70°C Active   24-SOIC     525 0 75
Default Photo
Unité
$2.3421
Regarder
RFQ
Texas Instruments IC SCAN TEST DEVICE TXRX 24-SOIC 24-SOIC (0.295", 7.50mm Width) 74BCT Tape & Reel (TR)     Scan Test Device with Bus Transceivers Surface Mount   0°C ~ 70°C Active   24-SOIC     0 0 2000
Default Photo
Unité
$1.7160
Regarder
RFQ
Texas Instruments IC MEMORY DECODER 20SOIC 20-SOIC (0.295", 7.50mm Width) 74BCT Tube     Memory Decoder Surface Mount   0°C ~ 75°C Active   20-SOIC     0 0 125